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CAD  

We offer a variety of CAD processing capabilities, including source CAD translations, GenCAD and Gerber import capabilities.  Included in the CAD translation service is our Design For Testability (DFT) analysis.  Our goal is to provide rapid testability feedback which gives our customers the opportunity to make a  given design more testable and ultimately, more manufacturable.

 
Flying Probe  

We offer test development for the GenRad Pilot I™ and Pilot LX™ series of flying probe testers.  These solutions range from standard testing techniques to more advanced, powered techniques (i.e. Vectorless Testing, simple digital testing and many more advanced techniques).

 
In-Circuit  
 
We offer test development for the GenRad 227x™, 228x™ and TS12x™ series of in-circuit testers.  These solutions range from standard testing techniques to more advanced techniques (i.e. Boundary Scan, FLASH, ISP, embedded programming and many more advanced techniques).
 
Board Test

We provide a testing service for those customers who require additional testing capacity. 

Quotes

We provide the customer a comprehensive list of items that are required to accurately quote a test solution.

 

 

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Copyright © 2001 Test Development Incorporated
Last modified: June 16, 2003