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In-Circuit 
CAD Flying Probe In-Circuit Board Test Quotes

 

 

 

 

Key Benefits

bulletHighly Skilled ATE Engineering Staff
bulletTimely Development Cycle
bulletAdvanced Tools and Techniques
bulletHighly Competitive Pricing Structure

Capabilities

Program Development
Program Development on the GenRad 228x™/TS12x™ In-circuit test systems is both fast and comprehensive.  Using GenRad's Alchemist 98™/III™ and CB/Test™ products makes the transition from source CAD to finished product simple.  We use Flynn Systems FS-ATG™ Automatic Test Vector Generation SW for PLD, CPLD and FPGA test vector generation.  Flynn's onTAP™ Boundary Scan Test Development Software provides us with a cost effective Boundary Scan Solution.  The combination of these tools, along with our high level engineers, makes the entire development process seamless and quick.

 

 

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Copyright © 2001 Test Development Incorporated
Last modified: June 16, 2003